CHEN, Haojun. Calculation and Reliability Analysis of Epitaxial Layer Thickness Using Infrared Interferometry Based on the Constant Refractive Index Assumption. Scientific Journal of Technology, [S. l.], v. 8, n. 2, p. 7–11, 2026. DOI: 10.54691/528g3s91. Disponível em: https://sjtechnology.org/index.php/ojs/article/view/319. Acesso em: 1 aug. 2026.